Publication overview

Extracting Higher Order Critical Points and Topological Simplification of 3D Vector Fields
Authors:
T. Weinkauf, H. Theisel, K. Shi, H.-C. Hege and H.-P. Seidel
Conference:
Proc. IEEE Visualization, 2005
Files:
Bibtex:


@INPROCEEDINGS{Weinkauf:2005:IEEE,
author = {T. Weinkauf and H. Theisel and K. Shi and H.-C. Hege and H.-P. Seidel},
title = {Extracting Higher Order Critical Points and Topological Simplification
of 3D Vector Fields},
booktitle = {Proc. IEEE Visualization 2005},
year = {2005},
pages = {559--556},
address = {{Minneapolis}},
month = {23.-28. Oktober 2005},
comment = {2005.0001.00},
Recent news:
19.04.2017

Research Seminar Announcement

In the course of the Visual Computing research seminar Dr. Evgeny Gladilin from the Leibniz Institute of Plant Genetics and Crop Plant Research (IPK) Gatersleben will give a talk with subsequent discussion about the topic Aufgaben der Bildanalyse in quantitativer Pflanzenforschung.

We would like to invite everyone interested to join us. The research seminar will take place in on Friday 21.04.2017, 13:00 c.t. in G29-R335.

To the overview…